| Mfg Part Number: MLL4703 | NSN : 5961-01-465-5108 | NIIN : 014655108 |
| CAGE Code : 04713 | Manufacturer: Freescale Semiconductor Inc | Item Name : Semiconductor Device Diode |
| FSC : 5961 Semiconductor Devices and Associated Hardware |
Thank you for choosing to rely on Nascent Aviation for all your operational needs. You have reached our NSN RFQ Page where you can request quotes for our most in-demand NSN 5961-01-465-5108 parts and components with Semiconductor Device Diode manufactured by MFG Freescale Semiconductor Inc. Some of the items we carry include part number MLL4703, and various others, those of which have been thoroughly assessed for quality and reliability. At Nascent Aviation, we set ourselves apart from other distributors in our steadfast commitment to providing guidance at every stage of the procurement process, offering rapid lead times, cost savings, and exceptional customer service
Nascent Aviation is commended for making quality the cornerstone of its operations, ensuring that our customers never have to worry about the authenticity of our products. The NSN 5961-01-465-5108 products MLL4703 that we feature by Freescale Semiconductor Inc are paired alongside their corresponding CAGE Code 04713 and FSC 5961 Semiconductor Devices and Associated Hardware More than that, the NSN items we carry are subject to a series of rigorous quality assurance measures, tests, verifications, and assessments, as applicable. If you find a product that suits your operations, we invite you to fill out and submit an RFQ form for your comparisons. Alternatively, you can call or email us directly; we are available 24/7x365!
| NSN | FSC | NIIN | CLS | Hazmat | DEMIL | Cancelled NSN |
|---|---|---|---|---|---|---|
| 5961-01-465-5108 Item Description: Semiconductor Device Diode | 5961 | 014655108 | 0 | N | A | |
| CIIC | HCC | ESD | PMIC | Criticality | ENAC | |
| U | A | A | 0 | |||
| Part Number | ISC | RNVC | RNCC | HCC | MSDS | SADC |
| Mll4703 | 5 | 9 | 3 |
| MRC | Criteria | Characteristic |
|---|---|---|
| ABBH | INCLOSURE MATERIAL | GLASS |
| AGAV | END ITEM IDENTIFICATION | 6625013912969E/IFSCM04713 |
| AKPV | MOUNTING FACILITY QUANTITY | 2 |
| AXGY | MOUNTING METHOD | PRESS FIT |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 56.0 MAXIMUM FORWARD GATE TO SOURCE BREAKDOWN VOLTAGE AND 1.8 MINIMUM FORWARD GATE TO SOURCE BREAKDOWN VOLTAGE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 1.50 NANOAMPERES FORWARD CURRENT, AVERAGE PEAK |
| CTRD | POWER RATING PER CHARACTERISTIC | 500.0 MILLIWATTS SMALL-SIGNAL OUTPUT POWER, COMMON-BASE PRESET |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | -65.0 DEG CELSIUS CASE AND 200.0 DEG CELSIUS CASE |
| FEAT | SPECIAL FEATURES | HERMETICALLYSEALED |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 CASE |
| ABBH | INCLOSURE MATERIAL | GLASS |
| AGAV | END ITEM IDENTIFICATION | 6625013912969E/IFSCM04713 |
| AKPV | MOUNTING FACILITY QUANTITY | 2 |
| AXGY | MOUNTING METHOD | PRESS FIT |
| CTMZ | SEMICONDUCTOR MATERIAL | SILICON |
| CTQN | VOLTAGE RATING IN VOLTS PER CHARACTERISTIC | 56.0 MAXIMUM FORWARD GATE TO SOURCE BREAKDOWN VOLTAGE AND 1.8 MINIMUM FORWARD GATE TO SOURCE BREAKDOWN VOLTAGE |
| CTQX | CURRENT RATING PER CHARACTERISTIC | 1.50 NANOAMPERES FORWARD CURRENT, AVERAGE PEAK |
| CTRD | POWER RATING PER CHARACTERISTIC | 500.0 MILLIWATTS SMALL-SIGNAL OUTPUT POWER, COMMON-BASE PRESET |
| CTSG | MAXIMUM OPERATING TEMP PER MEASUREMENT POINT | -65.0 DEG CELSIUS CASE AND 200.0 DEG CELSIUS CASE |
| FEAT | SPECIAL FEATURES | HERMETICALLYSEALED |
| TTQY | TERMINAL TYPE AND QUANTITY | 2 CASE |
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